Performance and Reliability Trade-offs for Integrated Circuits

Elyse Rosenbaum

Melvin and Anne Louise Hassebrock Professor in Electrical and Computer Engineering, University of Illinois Urbana-Champaign on November 12, 2021 at 10:15 AM in EB3 2232

Elyse Rosenbaum is the Melvin and Anne Louise Hassebrock Professor in Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign. She received the Ph.D. degree in electrical engineering from University of California, Berkeley. She is the director of the NSF-supported Center for Advanced Electronics through Machine Learning (CAEML), a joint project of the University of Illinois, Georgia Tech and North Carolina State University. Her current research interests include machine-learning aided behavioral modeling of microelectronic components and systems, compact models, circuit reliability simulation, component and system-level ESD reliability, and ESD-robust high-speed I/O circuit design.

Dr. Rosenbaum has authored or co-authored about 200 technical papers; she has been an editor for IEEE Transactions on Device and Materials Reliability and IEEE Transactions on Electron Devices. She was the recipient of a Best Student Paper Award from the IEDM, Outstanding and Best Paper Awards from the EOS/ESD Symposium, a Technical Excellence Award from the SRC, an NSF CAREER award, an IBM Faculty Award, and the ESD Association’s Industry Pioneer Recognition Award. She is a Fellow of the IEEE.

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